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Scanning Electron Microscope (SEM) Noise Isolation Design

Company: Westinghouse Electric Company

Major(s):
Primary: ME
Secondary: ESC

Non-Disclosure Agreement: NO

Intellectual Property: YES

A scanning Electron Microscope (SEM) is a sensitive surface topography measurement device capable of achieving one (1) nanometer resolutions. As part of the development of the eVinci® Microreactor, Westinghouse has purchased an SEM. The SEM is situated in the Etna material science testing center. In the SEM’s current position some environmental influences may be experienced by changes to the surrounding environment. For instance, a forklift being driven by, or a furnace rejecting heat to the room. While logistical planning can eliminate the influences of surrounding effects, it is desirable to enable operation of the SEM during all hours. The goal of this design team will be to design a noise and temperature isolation system to minimize the influence of surrounding environmental effects on SEM measurements. The solution shall enable precise measurement regardless of normal surrounding ambient lab conditions.